DocumentCode
1051309
Title
I-6 scanned surface photovoltage images of defects on semiconductors
Author
DiStefano, T.H.
Author_Institution
IBM Thomas J. Watson Research Center, Yorktown Heights, N.Y.
Volume
22
Issue
11
fYear
1975
Firstpage
1055
Lastpage
1055
Abstract
Summary form only. An abstract of the above-titled article taken from the Device Research Conference (24-26 June 1975, Carleton University, Ottawa, Ont., Canada) is presented.
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1975.18276
Filename
1478111
Link To Document