DocumentCode
1051375
Title
IIB-1 noise measurements on buried-channel charge-coupled devices
Author
Brodersen, R.W. ; Emmons, Stephen P.
Author_Institution
Texas Instruments Incorporated, Dallas, Tex
Volume
22
Issue
11
fYear
1975
Firstpage
1057
Lastpage
1058
Abstract
Summary form only. An abstract of the above-titled article taken from the Device Research Conference (24-26 June 1975, Carleton University, Ottawa, Ont., Canada) is presented.
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1975.18283
Filename
1478118
Link To Document