• DocumentCode
    1051454
  • Title

    TE characterization of resistive strip gratings on a dielectric slab using a single edge-mode expansion

  • Author

    Volakis, J.L. ; Lin, Y.C. ; Anastassiu, H.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    42
  • Issue
    2
  • fYear
    1994
  • fDate
    2/1/1994 12:00:00 AM
  • Firstpage
    205
  • Lastpage
    212
  • Abstract
    Closed-form expressions are derived for the TE scattering by a narrow resistive strip array in the presence of a dielectric slab. This is accomplished by introducing a single edge-mode expansion to represent the strip current density followed by a Galerkin´s solution of the pertinent integral equation. The accuracy of the derived approximate expressions are examined by comparison with a moment method solution and several curves are shown, illustrating how the different array parameters affect the reflectivity and transmissivity of the array. Particular attention is given to the free-standing resistive strip array where an equivalent uniform resistive sheet is constructed for simulating the original periodic structure. The reactance of this equivalent sheet is compared with published expressions pertinent to the metallic strip array
  • Keywords
    current density; dielectric materials; electromagnetic wave scattering; integral equations; reflectivity; Galerkin´s solution; TE characterization; TE scattering; approximate expressions; array parameters; closed-form expressions; dielectric slab; equivalent uniform resistive sheet; free-standing resistive strip array; integral equation; metallic strip array; moment method solution; reflectivity; resistive strip gratings; single edge-mode expansion; strip current density; transmissivity; Closed-form solution; Current density; Dielectrics; Gratings; Integral equations; Moment methods; Scattering; Slabs; Strips; Tellurium;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.277214
  • Filename
    277214