IIB-8 the charge transfer inefficiency of bulk charge-coupled devices between 77 and 300 K
Author :
Collet, M.G.
Author_Institution :
Philips Research Laboratories Eindhoven, The Netherlands
Volume :
22
Issue :
11
fYear :
1975
Firstpage :
1059
Lastpage :
1059
Abstract :
Summary form only. An abstract of the above-titled article taken from the Device Research Conference (24-26 June 1975, Carleton University, Ottawa, Ont., Canada) is presented.
