DocumentCode
1051779
Title
A Class of SIC Circuits: Theory and Application in BIST Design
Author
Shaochong, Lei ; Xueyan, Hou ; Zhibiao, Shao ; Feng, Liang
Author_Institution
Xi´´an Jiao Tong Univ., Xi´´an
Volume
55
Issue
2
fYear
2008
Firstpage
161
Lastpage
165
Abstract
This paper proposes a simplified algebraic model to present the complex configurations of single input change (SIC) circuits, and investigates the relationship between the SIC sequence and its generating circuit. Furthermore, several key properties of the studied sequence are provided and theoretically proved. Based on the above, we discover the commonness of different configurations of SIC circuits, and find the way to design the seed circuit at low overhead. To demonstrate our research results, a novel SIC circuit called seeded autonomous circular shift register (SACSR) circuit is presented. This new circuitry can automatically generate SIC sequences of more unique vectors. Finally, experimental results based on ISCAS85 Benchmark are provided to demonstrate the high performance of the proposed circuitry.
Keywords
built-in self test; shift registers; BIST design; ISCAS85 Benchmark; SACSR circuit; SIC circuit; built-in self test; seeded autonomous circular shift register; single input change sequence; Built-in self-test (BIST); property; seed; single input change (SIC) sequence;
fLanguage
English
Journal_Title
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher
ieee
ISSN
1549-7747
Type
jour
DOI
10.1109/TCSII.2007.903794
Filename
4443877
Link To Document