• DocumentCode
    1052008
  • Title

    Digital simulation of source-insulator interaction in HVDC pollution tests

  • Author

    Rizk, Farouk A.M. ; Nguyen, D.H.

  • Author_Institution
    Inst. de Recherche d´´Hydro-Quebec, Varennes, Que., Canada
  • Volume
    3
  • Issue
    1
  • fYear
    1988
  • fDate
    1/1/1988 12:00:00 AM
  • Firstpage
    405
  • Lastpage
    410
  • Abstract
    A technique is presented for digital computer simulation of the interaction between a polluted insulator and a high-voltage, direct-current test source. Both uncontrolled and feedback-controlled voltage-double sources are considered. The polluted insulator is represented by one or more arcs in series with the wet conducting layer. The arc is represented by a simple dynamic equation, and an attempt is made in the model to account for thermal phenomena in the unbridged wet layer. The simulation technique is then used to investigate the effect of the DC source parameters on the error obtained in the insulator flashover voltage. Both the effects of maximum and mean dynamic voltage drops are studied. It is shown that the approach applies well for both controlled and uncontrolled sources, while the effect of an external damping resistor is treated separately. Wherever possible the simulation results are compared to experiments, and in view of the complexity of the problem, the agreement is satisfactory
  • Keywords
    digital simulation; flashover; insulators; pollution; HVDC pollution tests; digital computer simulation; dynamic voltage drops; external damping resistor; feedback-controlled voltage-double sources; insulator flashover voltage; polluted insulator; source-insulator interaction; uncontrolled voltage-double test sources; wet conducting layer; Computer simulation; Damping; Digital simulation; Equations; Flashover; HVDC transmission; Insulation; Insulator testing; Pollution; Voltage;
  • fLanguage
    English
  • Journal_Title
    Power Delivery, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8977
  • Type

    jour

  • DOI
    10.1109/61.4271
  • Filename
    4271