• DocumentCode
    1052050
  • Title

    The Improvement of Polycrystalline Silicon TFTs Fabricated by Employing Periodic Metal Pads

  • Author

    Chang, Hsu-Yu ; Meng, Chao-Yu ; Tsai, Ming-Wei ; Yang, Bo-Chuan ; Chuang, Tzu-Hung ; Lee, Si-Chen

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
  • Volume
    53
  • Issue
    8
  • fYear
    2006
  • Firstpage
    1939
  • Lastpage
    1943
  • Abstract
    Polysilicon films with regular-sized and large grains were fabricated by employing periodic metal (Cr-Al) pads as the heat sinks and with underlying silicon oxynitride (SiON) as the heat absorption layer. The poly-Si could grow to regular hexagonal grains after excimer laser annealing (ELA). The thin-film transistors (TFTs) fabricated by this method show uniform characteristics that are suitable for large-area applications. The TFT achieves a field-effect mobility of 270 cm2/Vmiddots and an on-off current ratio exceeding 108 . It is found that the TFT with the smaller channel width and length results in a better subthreshold swing because it contains fewer grain boundaries and, thus, fewer defects. After comparing the performance of TFTs using either double-metal Cr-Al or single-metal Al photonic-crystal pads, it is found that the Cr could efficiently impede the diffusion of Al into Si during ELA
  • Keywords
    annealing; elemental semiconductors; excimer lasers; silicon; thin film transistors; Cr-Al; SiON; excimer laser annealing; field effect mobility; heat absorption layer; heat sinks; hexagonal grains; periodic metal pads; polycrystalline silicon; polysilicon films; silicon oxynitride; thin film transistors; Absorption; Active matrix organic light emitting diodes; Annealing; Atherosclerosis; Etching; Grain boundaries; Heat sinks; Semiconductor films; Silicon; Thin film transistors; Photonic crystal; polycrystalline silicon; thin-film transistor (TFT);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2006.877873
  • Filename
    1661899