DocumentCode
1052110
Title
Despeckling of TerraSAR-X Data Using Second-Generation Wavelets
Author
Gleich, Dusan ; Kseneman, Matej ; Datcu, Mihai
Author_Institution
Lab. for Signal Process. & Remote Control, Univ. of Maribor, Maribor, Slovenia
Volume
7
Issue
1
fYear
2010
Firstpage
68
Lastpage
72
Abstract
This letter presents the despeckling of synthetic aperture radar (SAR) images within the bandelet and contourlet domains. A model-based approach is presented for the despeckling of SAR images. The speckle-reduced estimate is found using the first-order Bayesian inference, and the best model´s parameters are estimated using the second-order Bayesian inference. Synthetic and real images are used for evaluating the qualities of the despeckling methods. The experimental results showed that the combination of Bayesian inference and bandelet transform outperforms the contourlet-based despeckling algorithm using synthetic data and objective measurements.
Keywords
geophysical image processing; geophysical techniques; image denoising; inference mechanisms; remote sensing by radar; speckle; synthetic aperture radar; wavelet transforms; TerraSAR-X; bandelet transform; contourlet-based despeckling algorithm; first-order Bayesian inference; image despeckling; second-generation wavelets; second-order Bayesian inference; synthetic aperture radar; Bayesian inference; speckle reduction; synthetic aperture radar (SAR); wavelet transform;
fLanguage
English
Journal_Title
Geoscience and Remote Sensing Letters, IEEE
Publisher
ieee
ISSN
1545-598X
Type
jour
DOI
10.1109/LGRS.2009.2020610
Filename
5061876
Link To Document