DocumentCode :
1052110
Title :
Despeckling of TerraSAR-X Data Using Second-Generation Wavelets
Author :
Gleich, Dusan ; Kseneman, Matej ; Datcu, Mihai
Author_Institution :
Lab. for Signal Process. & Remote Control, Univ. of Maribor, Maribor, Slovenia
Volume :
7
Issue :
1
fYear :
2010
Firstpage :
68
Lastpage :
72
Abstract :
This letter presents the despeckling of synthetic aperture radar (SAR) images within the bandelet and contourlet domains. A model-based approach is presented for the despeckling of SAR images. The speckle-reduced estimate is found using the first-order Bayesian inference, and the best model´s parameters are estimated using the second-order Bayesian inference. Synthetic and real images are used for evaluating the qualities of the despeckling methods. The experimental results showed that the combination of Bayesian inference and bandelet transform outperforms the contourlet-based despeckling algorithm using synthetic data and objective measurements.
Keywords :
geophysical image processing; geophysical techniques; image denoising; inference mechanisms; remote sensing by radar; speckle; synthetic aperture radar; wavelet transforms; TerraSAR-X; bandelet transform; contourlet-based despeckling algorithm; first-order Bayesian inference; image despeckling; second-generation wavelets; second-order Bayesian inference; synthetic aperture radar; Bayesian inference; speckle reduction; synthetic aperture radar (SAR); wavelet transform;
fLanguage :
English
Journal_Title :
Geoscience and Remote Sensing Letters, IEEE
Publisher :
ieee
ISSN :
1545-598X
Type :
jour
DOI :
10.1109/LGRS.2009.2020610
Filename :
5061876
Link To Document :
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