The minimal test set for multioutput threshold circuits implemented as sorting networks

It is shown that an n-input sorting network (SN) can be used to implement an n-variable symmetric threshold functions using the least amount of hardware. An algorithm to derive Boolean functions implemented on any line of any n-input threshold circuit Tⁿ implemented as a SN is given. A heuristic procedure for generating the minimal test set for any threshold circuit Tⁿ implemented as a Batcher´s SN or any other SN is presented. The number of tests required to detect all stuck-at faults in an n-input SN is determined. A highly regular structure using only one type of simple cell and a suitability for low-level pipelining are other advantages of the circuit Tⁿ. The circuit Tⁿ can be used as a basic building block of various circuitry supporting the use of all known unidirectional error detecting codes