DocumentCode :
1052148
Title :
Key nonlinear measurement events
Author :
Remley, Kate A. ; Schreurs, Dominique
Author_Institution :
Nat. Inst. of Standards & Technol., Boulder
Volume :
8
Issue :
4
fYear :
2007
Firstpage :
75
Lastpage :
78
Abstract :
In this article, we describe two engineer-friendly events - the Automatic RF Techniques Group (ARFTG) Nonlinear Measurements Workshop and the Nonlinear Vector Network Analyzer (NVNA) Users´ Forum - designed to let participants learn about and discuss issues related to large-signal and nonlinear measurements. Because new methods and applications of nonlinear measurements are being developed at a rapid pace, these events were organized to provide a forum where bench-level engineers and the research community alike could learn about the latest techniques and technologies and share experiences.
Keywords :
microwave measurement; network analysers; Automatic RF Techniques Group Nonlinear Measurements Workshop; Nonlinear Vector Network Analyzer Users Forum; large-signal measurement; nonlinear measurement events; Atmospheric measurements; Calibration; Instruments; Microwave measurements; Particle measurements; Performance analysis; Pulse measurements; Radio frequency; Signal analysis; Telephone sets;
fLanguage :
English
Journal_Title :
Microwave Magazine, IEEE
Publisher :
ieee
ISSN :
1527-3342
Type :
jour
DOI :
10.1109/MMW.2007.383304
Filename :
4271282
Link To Document :
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