• DocumentCode
    1052403
  • Title

    A universal large/small signal 3-terminal FET model using a nonquasistatic charge-based approach

  • Author

    Daniels, Robert R. ; Yang, Andrew T. ; Harrang, Jeff P.

  • Author_Institution
    Boeing Aerosp. & Electron., Seattle, WA, USA
  • Volume
    40
  • Issue
    10
  • fYear
    1993
  • fDate
    10/1/1993 12:00:00 AM
  • Firstpage
    1723
  • Lastpage
    1729
  • Abstract
    Introduces a charge-based nonquasistatic large/small signal FET model that is extracted from measured small signal S-parameter and DC data and can be applied to an arbitrary three-terminal FET structure. The model is based on general physical principles, and provides consistent topologies for both large and small signal simulations to frequencies above ft and over a wide range of node voltages. The procedure for extracting model elements includes deembedding linear parasitic elements and extracting bicubic, B-spline functions, which represent large signal model elements. The spline coefficients are calculated using a constrained least squares fit to a set of small signal parameters and/or DC currents that have been measured at a number of node voltage values. Advantages of this approach include fast parameter extraction for new FET structures, accuracy, computational efficiency, charge conservation, and the requirement of only a single model for all simulation modes. The model can also be used to interface device simulators (e.g., PISCES) with circuit simulators for accurate predictive modeling
  • Keywords
    S-parameters; field effect transistors; least squares approximations; semiconductor device models; splines (mathematics); B-spline functions; DC data; PISCES; S-parameter; charge conservation; computational efficiency; constrained least squares fit; deembedding; large signal; linear parasitic elements; node voltages; nonquasistatic charge-based approach; predictive modeling; simulation modes; small signal; spline coefficients; three-terminal FET model; Circuit simulation; Computational modeling; Current measurement; Data mining; FETs; Frequency; Predictive models; Spline; Topology; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.277326
  • Filename
    277326