• DocumentCode
    105241
  • Title

    Electro-Optical Modulation Processes in Si-PMOSFET LEDs Operating in the Avalanche Light Emission Mode

  • Author

    Kaikai Xu

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of California at Irvine, Irvine, CA, USA
  • Volume
    61
  • Issue
    6
  • fYear
    2014
  • fDate
    Jun-14
  • Firstpage
    2085
  • Lastpage
    2092
  • Abstract
    In this paper, the switching characteristics as associated with p + n gated MOSFET silicon LED are reviewed. By employing the insulated-gate terminal, which allows the adjustment of P+ source/drain to N-substrate junction breakdown voltage, it is demonstrated that the electro-optical modulation in the Si-PMOSFET device operates as gate-controlled diodes. The PMOSFET device can operate as a Si-diode LED or an Si gate-controlled diode LED. The main features of switching transitions of Si-diode LED and Si gate-controlled diode LED are characterized, and a model is developed to explain the modulation speed, which is then reviewed. The upper limit derived value for the expected maximum modulation of the device could be in the range of a few hundred GHz. According to the best of my knowledge, despite the low efficiency, the Si-PMOSFET light-emitting device will be a potentially key component for silicon photonic integrated circuits for future computing I/O applications.
  • Keywords
    MOSFET; electro-optical modulation; elemental semiconductors; light emitting diodes; semiconductor device breakdown; silicon; switching; N-substrate junction breakdown voltage; P+ source/drain; Si; Si-PMOSFET LED; avalanche light emission mode; electro-optical modulation; insulated-gate terminal; p+n gated MOSFET silicon LED; switching characteristics; upper limit derived value; CMOS integrated circuits; Light emitting diodes; Logic gates; Modulation; P-n junctions; Silicon; CMOS technology; emission efficiency enhancement; light intensity modulation; silicon LED; silicon LED.;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2014.2318277
  • Filename
    6810017