• DocumentCode
    1052483
  • Title

    Magnetic flux as affected by eddy currents in electromagnets

  • Author

    Pesch, Joseph A. ; Hendrickson, Kenneth E.

  • Author_Institution
    IBM General Systems Division, Rochester, Minn.
  • Volume
    9
  • Issue
    3
  • fYear
    1973
  • fDate
    9/1/1973 12:00:00 AM
  • Firstpage
    360
  • Lastpage
    361
  • Abstract
    A method has been developed for determining the current time constant τ at which eddy currents become detrimental to electromagnet operation. Plots of flux density B versus time, and current I versus time were made for various values of τ on electromagnets having a constant air gap and a fixed value of maximum current Imin the coil. Such an electromagnet can be approximated by a linear RL circuit as long as eddy current effects are negligible. τ was the time required for the current to reach 0.63 Im. This corresponds to the time constant in a linear RL circuit. Values of dB/dt were measured at τ and the relationship dB/dt = C/\\tau ^{m} , where m equals 1 and C is a constant, was found to be applicable for large values of τ, as expected in a linear RL circuit. The τ value τcat which m began to decrease from 1, determined the onset of eddy current effects since the circuit is no longer linear. Experimental results were compared to a theoretical solution for a ramp field applied to sheets of thickness δ. Calculations were performed of the time \\Delta t by which the flux density lags the applied field. Reasonably good correlation was obtained between \\Delta t and τc. Measurements were made on various soft magnetic materials in various thicknesses. The results provide a guide in selecting material and lamination thickness for a given application.
  • Keywords
    Eddy currents; Magnets; Silicon-iron alloys; Circuits; Coils; Eddy currents; Electromagnets; Linear approximation; Magnetic field measurement; Magnetic flux; Magnetic materials; Soft magnetic materials; Thickness measurement;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1973.1067613
  • Filename
    1067613