• DocumentCode
    1052834
  • Title

    Fabrication of highly transparent self-switching diodes using single layer indium tin oxide

  • Author

    Kettle, Jeff ; Perks, R.M. ; Hoyle, R.T.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Univ. of Manchester, Manchester
  • Volume
    45
  • Issue
    1
  • fYear
    2009
  • Firstpage
    79
  • Lastpage
    81
  • Abstract
    The fabrication of a self-switching diode (SSD) from a single layer of n-type indium tin oxide [In2O3:Sn (ITO)] is reported. The material was grown using reactive thermal evaporation and nanostructured using a focused ion beam. The resultant device demonstrates strong current rectification, as well as a high threshold and breakdown voltage, owing to the higher density of states associated with the material, when compared to other reported SSD-device material. It is shown that this work could potentially lead to a range of new transparent devices based on ITO, without the need to develop high quality p-type material.
  • Keywords
    electronic density of states; focused ion beam technology; indium compounds; nanofabrication; rectification; semiconductor device breakdown; semiconductor diodes; semiconductor growth; semiconductor materials; semiconductor thin films; thin film devices; tin; vacuum deposition; In2O3:Sn; breakdown voltage; current rectification; density of states; focused ion beam; highly transparent self-switching diodes; reactive thermal evaporation; single layer; threshold;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20092309
  • Filename
    4733122