• DocumentCode
    1052836
  • Title

    Optimized numerical models for semiconductor devices: Part I

  • Author

    McAfee, Loe C., Jr.

  • Author_Institution
    University of Michigan, Ann Arbor, MI
  • Volume
    23
  • Issue
    4
  • fYear
    1976
  • fDate
    4/1/1976 12:00:00 AM
  • Firstpage
    442
  • Lastpage
    447
  • Abstract
    This article presents some results from a study concerned with the trade-off between efficiency of numerical computation and accuracy of numerical models for semiconductor devices. The approach taken in this study was to use nonuniform grids in the finite difference equations approximating the semiconductor partial differential equations. A constrained minimization problem was formulated which analytically optimizes the numerical models. Several performance functions were found useful in optimizing the numerical models; the one presented here matches computed and "exact" terminal current responses. An example is presented to illustrate the results obtained with this performance function. The example model optimization shows that the optimized grids should have their greatest density in the space-charge region near the junction. An interesting side result is that when one performance function is optimized, apparently other desired features are optimized for numerical models for semiconductor devices. The Fletcher-Powell optimization algorithm was used with an adjoint gradient algorithm specifically developed for this study, without which the use of nonuniform grids would not have been practical.
  • Keywords
    Charge carrier processes; Difference equations; Finite difference methods; Finite wordlength effects; Grid computing; Low earth orbit satellites; Numerical models; Partial differential equations; Semiconductor devices; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1976.18423
  • Filename
    1478437