Properties of the MZOS surface wave convolver configuration

The MZOS (metal-zinc oxide-silicon dioxide-silicon) structure is investigated in order to provide a phenomenological understanding of the charge transfer and trapping properties of the zinc oxide layer. Results of fast-ramp measurements of capacitance versus voltage are presented, and on the basis of these results, some biasing and operating procedures are suggested to make effective use of the memory capabilities of this configuration or to avoid unwanted memory effects. A technique for optical imaging is described which offers several advantages over other surface wave imaging techniques. Finally, some potential applications are mentioned.