Title :
Transient responses of an exponential transmission line and its applications to high-speed backdriving in in-circuit test
Author :
Hsue, Ching-Wen ; Hechtman, Charles D.
Author_Institution :
AT&T Bell Labs., Princeton, NJ, USA
fDate :
3/1/1994 12:00:00 AM
Abstract :
Step responses of an exponential line terminated with resistive loads are evaluated by means of time-domain scattering parameters. The results are used to illustrate the interaction between a nonuniform line and a nonlinear load. We find that an exponential line could be used to compensate the nonlinear load effects in high-speed backdriving
Keywords :
S-parameters; integrated circuit testing; load (electric); step response; time-domain analysis; transient response; transmission line theory; exponential transmission line; high-speed backdriving; in-circuit test; nonlinear load; nonuniform line; resistive load termination; step responses; time-domain scattering parameters; transient responses; Distributed parameter circuits; Nonlinear distortion; Power system transients; Power transmission lines; Scattering parameters; Testing; Time domain analysis; Transient analysis; Transmission lines; Voltage;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
