Modal quasistatic parameters for coplanar multiconductor structures in multilayered substrates with arbitrary transverse dielectric anisotropy

Presents two algorithms to calculate the modal quasistatic parameters of a general multiconductor planar structure (multistrip or multislot) embedded in one of the interfaces of a multilayered substrate with arbitrary anisotropy in the transverse plane. Variational techniques in the spectral domain are used and a detailed study of trial functions is carried out. Very accurate results for both well known structures and new design data are presented to show the efficiency and generality of the method.<>