DocumentCode
1053618
Title
Application of a charge-control model to high-voltage power transistors
Author
Hower, Philip L.
Author_Institution
Westinghouse Electric Corporation, Pittsburgh, PA
Volume
23
Issue
8
fYear
1976
fDate
8/1/1976 12:00:00 AM
Firstpage
863
Lastpage
870
Abstract
Basic charge-control concepts are applied to the problem of predicting the static and large-signal switching characteristics of high-voltage transistors, with particular emphasis placed on the quasi-saturation region. Under the assumptions of unity base transport factor and one-dimensional current flow, simple equations for device electrical characteristics are derived in terms of readily determined device parameters. A two-region model is developed for predicting the turn-on process. Measured turn-on waveforms and collector characteristics are compared with the calculated behavior for a BVCE0 = 400 V switching transistor. A comparison with hFE (Ic ) data is also given for different temperatures. In all cases, good agreement with the predictions of the model is obtained. Implications of the model with respect to device design and characterization are discussed.
Keywords
Breakdown voltage; Doping; Electric variables; Equations; Impurities; Power transistors; Predictive models; Quasi-doping; Semiconductor process modeling; Temperature;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1976.18500
Filename
1478513
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