• DocumentCode
    1053618
  • Title

    Application of a charge-control model to high-voltage power transistors

  • Author

    Hower, Philip L.

  • Author_Institution
    Westinghouse Electric Corporation, Pittsburgh, PA
  • Volume
    23
  • Issue
    8
  • fYear
    1976
  • fDate
    8/1/1976 12:00:00 AM
  • Firstpage
    863
  • Lastpage
    870
  • Abstract
    Basic charge-control concepts are applied to the problem of predicting the static and large-signal switching characteristics of high-voltage transistors, with particular emphasis placed on the quasi-saturation region. Under the assumptions of unity base transport factor and one-dimensional current flow, simple equations for device electrical characteristics are derived in terms of readily determined device parameters. A two-region model is developed for predicting the turn-on process. Measured turn-on waveforms and collector characteristics are compared with the calculated behavior for a BVCE0= 400 V switching transistor. A comparison with hFE(Ic) data is also given for different temperatures. In all cases, good agreement with the predictions of the model is obtained. Implications of the model with respect to device design and characterization are discussed.
  • Keywords
    Breakdown voltage; Doping; Electric variables; Equations; Impurities; Power transistors; Predictive models; Quasi-doping; Semiconductor process modeling; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1976.18500
  • Filename
    1478513