DocumentCode
1053990
Title
Fabrication and performance of selectively oxidized vertical-cavity lasers
Author
Choquette, Kent D. ; Lear, K.L. ; Schneider, R.P., Jr. ; Geib, K.M. ; Figiel, J.J. ; Hull, Robert
Author_Institution
Photonics Res. Dept., Sandia Nat. Labs., Albuquerque, NM, USA
Volume
7
Issue
11
fYear
1995
Firstpage
1237
Lastpage
1239
Abstract
We report the high yield fabrication and reproducible performance of selectively oxidized vertical-cavity surface emitting lasers. We show that linear oxidation rates of AlGaAs without an induction period allows reproducible fabrication of buried oxide current apertures within monolithic distributed Bragg reflectors. The oxide layers do not induce obvious crystalline defects, and continuous wave operation in excess of 650 h has been obtained. The high yield fabrication enables relatively high laser performance over a wide wavelength span. We observe submilliamp threshold currents over a wavelength range of up to 75 nm, and power conversion efficiencies at 1 mW output power of greater than 20% over a 50-nm wavelength range.<>
Keywords
III-V semiconductors; aluminium compounds; distributed Bragg reflector lasers; gallium arsenide; laser cavity resonators; oxidation; quantum well lasers; surface emitting lasers; 1 mW; 20 percent; 650 h; 980 nm; AlGaAs; buried oxide current apertures; continuous wave operation; crystalline defects; high yield fabrication; linear oxidation rates; monolithic distributed Bragg reflectors; output power; oxide layers; power conversion efficiencies; relatively high laser performance; reproducible performance; selectively oxidized vertical-cavity surface emitting lasers; submilliamp threshold currents; wide wavelength span; Apertures; Crystallization; Distributed Bragg reflectors; Optical device fabrication; Oxidation; Power conversion; Power generation; Surface emitting lasers; Threshold current; Vertical cavity surface emitting lasers;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/68.473457
Filename
473457
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