• DocumentCode
    1054157
  • Title

    Why Waste Time on Roadmaps When We Don´t Have Cars?

  • Author

    Vallett, David P.

  • Author_Institution
    Div. of IBM Global Eng. Solutions, Essex Junction
  • Volume
    7
  • Issue
    1
  • fYear
    2007
  • fDate
    3/1/2007 12:00:00 AM
  • Firstpage
    5
  • Lastpage
    10
  • Abstract
    Reliability and yield depend on timely accurate failure analysis (FA). While scaling and new materials continue to drive integrated circuit performance, key areas of analytical technology remain largely stagnant. FA roadmaps and whitepapers detail major challenges facing the industry, but research, development, and tool commercialization are languid. Unlike the mainstream activities of design, manufacturing, and test, FA suffers from a loss of focus, a lack of funding, and a small commercial market. After a review of major shortcomings in analytical capability, this paper will discuss barriers to analytical technology development and propose alternatives for providing a more fertile infrastructure for requisite research and development.
  • Keywords
    failure analysis; research and development; semiconductor device manufacture; failure analysis; research and development; tool commercialization; Automotive materials; Circuit testing; Commercialization; Failure analysis; Integrated circuit reliability; Integrated circuit technology; Integrated circuit yield; Manufacturing industries; Performance analysis; Research and development; Failure analysis (FA); R&D planning; research and development (R&D) management;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2007.899666
  • Filename
    4271510