DocumentCode :
1054240
Title :
Trigger reliability of xenon flashlamps
Author :
Hug, William F. ; Lee, Robert C.
Author_Institution :
Xerox Electro-Optical Systems, Pasadena, CA
Volume :
23
Issue :
10
fYear :
1976
fDate :
10/1/1976 12:00:00 AM
Firstpage :
1166
Lastpage :
1169
Abstract :
The probability that a trigger pulse will successfully allow a driver circuit to discharge its energy through a xenon flashlamp is discussed. Based on a classical description of trigger spark formation and propagation statistics, the misflash probability, Pm, is described in terms of the ionization rate in the flash-lamp, β; the trigger pulsewidth, te; and the normalized trigger pulse overvoltage (Vs- Vst)/Vdc. This model was experimentally validated for series and parallel trigger circuits over a broad range of trigger pulse voltages, Vs, and pulseforming network voltages, VB.
Keywords :
Driver circuits; Ionization; Probability; Pulse circuits; Space vector pulse width modulation; Sparks; Statistics; Trigger circuits; Voltage control; Xenon;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1976.18563
Filename :
1478576
Link To Document :
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