Title :
Trigger reliability of xenon flashlamps
Author :
Hug, William F. ; Lee, Robert C.
Author_Institution :
Xerox Electro-Optical Systems, Pasadena, CA
fDate :
10/1/1976 12:00:00 AM
Abstract :
The probability that a trigger pulse will successfully allow a driver circuit to discharge its energy through a xenon flashlamp is discussed. Based on a classical description of trigger spark formation and propagation statistics, the misflash probability, Pm, is described in terms of the ionization rate in the flash-lamp, β; the trigger pulsewidth, te; and the normalized trigger pulse overvoltage (Vs- Vst)/Vdc. This model was experimentally validated for series and parallel trigger circuits over a broad range of trigger pulse voltages, Vs, and pulseforming network voltages, VB.
Keywords :
Driver circuits; Ionization; Probability; Pulse circuits; Space vector pulse width modulation; Sparks; Statistics; Trigger circuits; Voltage control; Xenon;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1976.18563