The single event upset response of the Analog Devices, ADSP2100A, digital signal processor

The authors present the results of a radiation evaluation program carried out on the ADSP2100A, which is a single-chip microprocessor optimized for 12.5 MIPS digital signal processing. Single event upset/latch-up (SEU/SEL) testing using Californium-252 was the primary aim of this program; however, accelerator heavy-ion and proton SEU/SEL data as well as total ionizing dose data are also presented. Californium-252 SEU testing covered both 12. 5-μm and 21.3-μm epitaxial layer DSPs, whereas only the 12.5-μm type was tested with heavy ions and protons. Heavy-ion SEU testing covered the LET (linear energy transfer) range of 3.4 to 79.2 MeV/(mg/cm²) and SEU testing covered the proton energies of 200, 500 and 800 MeV. A total ionizing dose rate of 64.0 rd(Si)/min was used for the cobalt-60 testing. The hardware design and software used are described and details of the various tests and test facilities are given. The authors report on the use of the SEU data for the calculation of expected in-orbit upset rates using the CREME suite of programs