DocumentCode :
1054758
Title :
A Model for Wafer Fabrication Dynamics in Integrated Circuit Manufacturing
Author :
Dayhoff, Judith E. ; Atherton, Robert W.
Author_Institution :
Judith Dayhoff & Associates, Inc., Box 4029, Mountain View, CA 94040, USA
Volume :
17
Issue :
1
fYear :
1987
Firstpage :
91
Lastpage :
100
Abstract :
Integrated circuit manufacturing has major operations of fabrication, sort, assembly, and test. The dynamic behavior of these operations can be modeled in terms of a highly structured queueing network. A model is presented of the components and interactions of wafer movements, processing equipment, and process steps. The model considers multiple process flows, fab organization and layout, and equipment properties such as batch size, process time, failure, and repair distributions. The model is implemented as a discrete event simulation and has been used in a number of case studies concerning realistic factory situations. This simulation model is general and can be used to study many types of discrete manufacturing.
Keywords :
Assembly; Circuit testing; Discrete event simulation; Fabrication; Integrated circuit manufacture; Integrated circuit modeling; Integrated circuit testing; Production facilities; Semiconductor device modeling; Virtual manufacturing;
fLanguage :
English
Journal_Title :
Systems, Man and Cybernetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9472
Type :
jour
DOI :
10.1109/TSMC.1987.289336
Filename :
4075658
Link To Document :
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