Title :
High-performance InP Gunn devices for fundamental-mode operation in D-band (110-170 GHz)
Author :
Eisele, Heribert ; Haddad, George I.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
fDate :
11/1/1995 12:00:00 AM
Abstract :
InP Gunn devices with an n+nn+ structure and a graded doping profile in the active region were designed, fabricated, and tested for fundamental-mode operation at D-band frequencies. Improved heat dissipation significantly increased the available RF output power and power levels of more than 90 mW up to frequencies around 135 GHz, more than 130 mW at 131.7 GHz, and more than 60 mW at 151 GHz are achieved in fundamental-mode operation. These are the highest RF power levels reported to date from any Gunn devices. These InP Gunn devices with dc-to-RF conversion efficiencies up to 2.5% around 132 GHz also exhibit excellent noise performance and the typical phase noise up to the highest RF power levels is well below -100 dBc/Hz, measured at a frequency off-carrier of 500 kHz
Keywords :
Gunn devices; III-V semiconductors; indium compounds; millimetre wave devices; phase noise; semiconductor device noise; semiconductor device testing; 110 to 170 GHz; 2.5 percent; 60 to 130 mW; D-band frequencies; InP; InP Gunn devices; RF output power; dc-to-RF conversion efficiencies; frequency off-carrier; fundamental-mode operation; graded doping profile; heat dissipation; n+nn+ structure; noise performance; phase noise; Doping profiles; Frequency measurement; Gunn devices; Indium phosphide; Noise level; Phase noise; Power generation; Power measurement; Radio frequency; Testing;
Journal_Title :
Microwave and Guided Wave Letters, IEEE