Title :
Transport along deformable microfabricated channel
Author_Institution :
Sch. of Phys. & Electron. Eng., Northwest Normal Univ., Lanzhou, China
Abstract :
Investigation of the entrainment of fluids induced by a wavy deformation along walls in a flat-plane microchannel is conducted by using the relaxed model with velocity-slip boundary conditions. Flow patterns tuned by critical reflux values a/sub 0/ and Reynolds number are demonstrated especially for the free pumping case. Results show that once the cross-section of the microchannel is narrowed down (velocity-slip increases) there will be earlier backward flows.
Keywords :
channel flow; heat sinks; integrated circuit packaging; microfluidics; rarefied fluid dynamics; slip flow; IC packages; Reynolds number; VLSI chip heat dissipation; backward flows; critical reflux values; deformable microfabricated channel; flat-plane microchannel; flow patterns; fluid entrainment; free pumping case; homogeneous rarefied gas; microchannel cross-section narrowing; microelectromechanical systems; relaxed model; velocity-slip boundary conditions; wavy deformation;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20020964
