• DocumentCode
    1054998
  • Title

    Threshold Voltage Model of Short-Channel FD-SOI MOSFETs With Vertical Gaussian Profile

  • Author

    Zhang, Guohe ; Shao, Zhibiao ; Zhou, Kai

  • Volume
    55
  • Issue
    3
  • fYear
    2008
  • fDate
    3/1/2008 12:00:00 AM
  • Firstpage
    803
  • Lastpage
    809
  • Abstract
    A novel approximation of 2-D potential function perpendicular to the channel for fully depleted (FD) silicon-on-insulator (SOI) MOSFETs on films with vertical Gaussian profile is proposed in the paper, then an analytical threshold voltage model is derived. The model agrees well with the MEDICI numerical simulation results. It represents a feasible way to find the threshold voltage and gives some reference points in developing new 2-D models for nonuniform FD-SOI devices.
  • Keywords
    Gaussian processes; MOSFET; silicon-on-insulator; short-channel FD-SOI MOSFET; threshold voltage model; vertical Gaussian profile; Analytical models; Annealing; Collision mitigation; Doping; Gaussian distribution; MOSFETs; Poisson equations; Semiconductor process modeling; Silicon on insulator technology; Threshold voltage; Fully depleted (FD) silicon-on-insulator (SOI) MOSFETs; Gaussian; threshold voltage model;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2007.914832
  • Filename
    4444828