DocumentCode
1055016
Title
Introduction to the Special Issue on the 2008 IEEE International Solid-State Circuits Conference
Author
Ham, Donhee ; Hidaka, Hideto ; Ho, Ron ; Krishnamurthy, Ram K.
Volume
44
Issue
1
fYear
2009
Firstpage
3
Lastpage
6
Abstract
The 29 papers in this special issue are drawn from the IEEE International Solid-State Circuits Conference (ISSCC), held in San Francisco, CA, February 3-7, 2008.
Keywords
Baseband; CMOS image sensors; CMOS process; Circuit testing; Clocks; Dynamic voltage scaling; Microprocessors; Multiaccess communication; Solid state circuits; Special issues and sections;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2008.2008036
Filename
4735546
Link To Document