Title :
Introduction to the Special Issue on the 2008 IEEE International Solid-State Circuits Conference
Author :
Ham, Donhee ; Hidaka, Hideto ; Ho, Ron ; Krishnamurthy, Ram K.
Abstract :
The 29 papers in this special issue are drawn from the IEEE International Solid-State Circuits Conference (ISSCC), held in San Francisco, CA, February 3-7, 2008.
Keywords :
Baseband; CMOS image sensors; CMOS process; Circuit testing; Clocks; Dynamic voltage scaling; Microprocessors; Multiaccess communication; Solid state circuits; Special issues and sections;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2008.2008036
