DocumentCode :
1055284
Title :
RazorII: In Situ Error Detection and Correction for PVT and SER Tolerance
Author :
Das, Shidhartha ; Tokunaga, Carlos ; Pant, Sanjay ; Ma, Wei-Hsiang ; Kalaiselvan, Sudherssen ; Lai, Kevin ; Bull, David M. ; Blaauw, David T.
Author_Institution :
ARM Ltd., Cambridge
Volume :
44
Issue :
1
fYear :
2009
Firstpage :
32
Lastpage :
48
Abstract :
Traditional adaptive methods that compensate for PVT variations need safety margins and cannot respond to rapid environmental changes. In this paper, we present a design (RazorII) which implements a flip-flop with in situ detection and architectural correction of variation-induced delay errors. Error detection is based on flagging spurious transitions in the state-holding latch node. The RazorII flip-flop naturally detects logic and register SER. We implement a 64-bit processor in 0.13 mum technology which uses RazorII for SER tolerance and dynamic supply adaptation. RazorII based DVS allows elimination of safety margins and operation at the point of first failure of the processor. We tested and measured 32 different dies and obtained 33% energy savings over traditional DVS using RazorII for supply voltage control. We demonstrate SER tolerance on the RazorII processor through radiation experiments.
Keywords :
error correction; error detection; flip-flops; Razor II flip-flop; adaptive method; architectural correction; energy saving; in situ error detection; register SER; state-holding latch node; supply voltage control; variation-induced delay error; Circuits; Delay; Dynamic voltage scaling; Error correction; Flip-flops; Fluctuations; Frequency; Safety; Temperature; Voltage control; Adaptive circuits; dynamic voltage and frequency scaling (DVFS); process variations; self-tuning processor; single event upsets;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2008.2007145
Filename :
4735568
Link To Document :
بازگشت