DocumentCode :
1055350
Title :
Modeling light reflection for computer color vision
Author :
Lee, Hsien-Che ; Breneman, Edwin J. ; Schulte, Carl P.
Author_Institution :
Eastman Kodak Co., Rochester, NY, USA
Volume :
12
Issue :
4
fYear :
1990
fDate :
4/1/1990 12:00:00 AM
Firstpage :
402
Lastpage :
409
Abstract :
In computer vision applications, analysis of shading information requires a proper model of light reflection from object surfaces. To overcome the shortcoming of the most often used model and to extend the reflection model for computer color vision, an examination is made of the light reflection problem using the bidirectional spectral-reflectance distribution function (BSRDF) to specify both incident- and reflected-beam geometries. It is shown that the product form can still be retained for a polychromatic light source under two lighting conditions: the light source is collimated; or the spectral factor and the geometric factor can be separated for both the light source and the BSRDF of the surface. The reflection model is then applied to the formulation of a neutral-interface-reflection model, which is tested experimentally. The results show the adequacy of this type of model for surfaces of some material compositions, e.g. plastics, plant leaves, painted surfaces, orange peels, and some glossy cloth, but not for others, e.g. colored paper and some ceramics
Keywords :
colour; computer vision; light reflection; reflectivity; bidirectional spectral-reflectance distribution function; collimated light source; computer color vision; geometric factor; glossy cloth; incident beam geometry; light reflection; neutral-interface-reflection model; orange peels; painted surfaces; plant leaves; plastics; polychromatic light source; reflected-beam geometries; shading; spectral factor; Application software; Computational geometry; Computer vision; Distributed computing; Distribution functions; Information analysis; Light sources; Optical collimators; Optical reflection; Solid modeling;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/34.50626
Filename :
50626
Link To Document :
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