• DocumentCode
    1055438
  • Title

    The role of ceramic voids and fracture propagation in shelf life failure of tubes

  • Author

    Haas, George A. ; Gray, Henry F. ; Thomas, Richard E. ; Pankey, Titus, Jr.

  • Author_Institution
    Naval Research Laboratory, Washington, DC
  • Volume
    24
  • Issue
    1
  • fYear
    1977
  • fDate
    1/1/1977 12:00:00 AM
  • Firstpage
    62
  • Lastpage
    66
  • Abstract
    Small tubes having an internal volume of 0.1 cm3were found to become gassy during shelf life and subsequently to arc when turned on. Quadrupole mass analysis and Auger electron spectroscopy were used to identify internal gasses and deposits on electrodes of gassy tubes. Gasses released during ceramic fracture propagation were also studied. The results indicate that for the tubes investigated, the predominant failure mechanism involved the growth of ceramic micro cracks which are connected to the interior of the tube. As the crack propagates, it releases N2which was trapped in the voids of the ceramic. Cracks extending only a fraction of the ceramic wall thickness are sufficient to liberate enough N2into the tube to correspond to a pressure of 10-3torr, which will result in an arc during turn-on.
  • Keywords
    Calibration; Ceramics; Current measurement; Electrodes; Electron traps; Electron tubes; Failure analysis; Helium; Mass spectroscopy; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1977.18679
  • Filename
    1478871