DocumentCode
1055438
Title
The role of ceramic voids and fracture propagation in shelf life failure of tubes
Author
Haas, George A. ; Gray, Henry F. ; Thomas, Richard E. ; Pankey, Titus, Jr.
Author_Institution
Naval Research Laboratory, Washington, DC
Volume
24
Issue
1
fYear
1977
fDate
1/1/1977 12:00:00 AM
Firstpage
62
Lastpage
66
Abstract
Small tubes having an internal volume of 0.1 cm3were found to become gassy during shelf life and subsequently to arc when turned on. Quadrupole mass analysis and Auger electron spectroscopy were used to identify internal gasses and deposits on electrodes of gassy tubes. Gasses released during ceramic fracture propagation were also studied. The results indicate that for the tubes investigated, the predominant failure mechanism involved the growth of ceramic micro cracks which are connected to the interior of the tube. As the crack propagates, it releases N2 which was trapped in the voids of the ceramic. Cracks extending only a fraction of the ceramic wall thickness are sufficient to liberate enough N2 into the tube to correspond to a pressure of 10-3torr, which will result in an arc during turn-on.
Keywords
Calibration; Ceramics; Current measurement; Electrodes; Electron traps; Electron tubes; Failure analysis; Helium; Mass spectroscopy; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1977.18679
Filename
1478871
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