DocumentCode :
1055520
Title :
New insulated-gate thyristor structure with MOSFET coupled base regions
Author :
Ajit, J.S.
Author_Institution :
Int. Rectifier Corp., El Segundo, CA, USA
Volume :
17
Issue :
7
fYear :
1996
fDate :
7/1/1996 12:00:00 AM
Firstpage :
348
Lastpage :
351
Abstract :
A new insulated-gate thyristor (IGTH) structure in which the base of n-p-n transistor is coupled to the base of p-n-p transistor through a MOSFET is described for the first time, In the new structure, called base coupled insulated gate thyristor (BC-IGTH), the parasitic lateral p-n-p carrier injection inherent in previously reported thyristor structures such as the MCT, BRT, and IGTH is absent. The absence of parasitic lateral p-n-p carrier injection results in low on state voltage drop and high controllable current capability for this structure. The turn-on process in the new structure is fundamentally different from other MOS-gated thyristor structures in that in the new structure, the higher gain n-p-n transistor is turned-on first, which then provides the base drive for the lower gain p-n-p transistor. Multicellular 800 V devices of the new thyristor structure were fabricated using a double-diffused DMOS process, and were found to give on-state drop of 1.1 V at 200 A/cm/sup 2/, and controllable currents in excess of 100 A/cm/sup 2/ were obtained by forming MOS-gate controlled emitter-to-base resistive shorts.
Keywords :
MOS-controlled thyristors; power semiconductor switches; 1.1 V; MOS-gated thyristor; MOSFET coupled base regions; base coupled structure; double-diffused DMOS process; emitter-to-base resistive shorts; high controllable current capability; insulated-gate thyristor structure; multicellular devices; n-p-n transistor base; onstate voltage drop; p-n-p transistor base; turn-on process; Current density; Electronic ballasts; Electrons; HVDC transmission; Insulation; Low voltage; MOSFET circuits; Manufacturing; Thyristors; Voltage control;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.506363
Filename :
506363
Link To Document :
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