• DocumentCode
    1055565
  • Title

    Numerical investigation of turn-on conditions in TRAPATT oscillators

  • Author

    Bogan, Zeev ; Frey, Jeffrey

  • Author_Institution
    Wright-Patterson Air Force Base, OH
  • Volume
    24
  • Issue
    2
  • fYear
    1977
  • fDate
    2/1/1977 12:00:00 AM
  • Firstpage
    128
  • Lastpage
    135
  • Abstract
    A computer simulation of TRAPATT diode-circuit interactions has been used to study high-frequency oscillatory phenomena that are seen experimentally to occur simultaneously with TRAPATT initiation. The simulation combines a solution of the diode internal dynamics using the method of characteristics with a time-domain coaxial-circuit analysis. By determining its dependence on circuit and diode bias conditions, the high-frequency oscillation is shown to be a relaxation, not an IMPATT oscillation. The relaxation oscillation can be tuned by adjusting to TRAPATT bias current to minimize TRAPATT start-up time. A two-step (high-low) bias pulse, or ingenious utilization of ringing in the bias circuit, can also be used to minimize start-up time.
  • Keywords
    Analytical models; Circuit simulation; Coaxial components; Computational modeling; Computer simulation; Diodes; Electron traps; Frequency; Oscillators; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1977.18691
  • Filename
    1478883