Title :
Deutsche Airbus flight test of Rosemount smart probe for distributed air data systems
Author :
Hagen, Floyd W. ; Seidel, Harald
Author_Institution :
Rosemount Aerosp. Inc., Burnsvill, MN, USA
fDate :
4/1/1994 12:00:00 AM
Abstract :
Deutsche Aerospace Airbus (division of DASA) and Rosemount Aerospace Inc. Jointly sponsored a flight test program to evaluate in-flight performance of distributed multifunction air data smart probes. The probes measure pitot pressure, static pressure, and angle of attack. The tests were conducted at the DLR Flight Test Center, near Braunschweig, Germany. Two smart probes were installed on the DLR VFW 614 ATTAS Flight Test Aircraft and tested between June of 1992 and January of 1993. Flight test results are presented together with suggested air data system architectures, including ARINC 738, that can be used with the distributed smart probe concept. New architectures are developed for future commercial aircraft. The smart probe concept offers several advantages including reduced weight and size, reduced number of line replaceable units (LRUs), and increased reliability. Overall cost of ownership is significantly lowered.<>
Keywords :
aerospace computer control; aerospace test facilities; aircraft control; aircraft instrumentation; angular measurement; calibration; computer architecture; computerised instrumentation; intelligent sensors; position measurement; pressure measurement; probes; 1992; 1993; ARINC 738; DASA; DLR Flight Test Center; Deutsche Airbus flight test; Rosemount Aerospace Inc.; Rosemount smart probe; air data system architectures; angle of attack; cost; distributed air data systems; distributed multifunction air data smart probes; in-flight performance; line replaceable units; pitot pressure; probe transducer unit; reliability; size; static pressure; weight; Aerospace electronics; Aerospace testing; Aircraft; Central air conditioning; Data systems; Goniometers; Pressure measurement; Probes; System testing; Transducers;
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE
