• DocumentCode
    1055732
  • Title

    High-Performance Twin Silicon Nanowire MOSFET (TSNWFET) on Bulk Si Wafer

  • Author

    Suk, Sung Dae ; Yeo, Kyoung Hwan ; Cho, Keun Hwi ; Li, Ming ; Yeoh, Yun Young ; Lee, Sung-Young ; Kim, Sung Min ; Yoon, Eun Jung ; Kim, Min Sang ; Oh, Chang Woo ; Kim, Sung Hwan ; Kim, Dong-Won ; Park, Donggun

  • Author_Institution
    Samsung Electron. Co., Yongin
  • Volume
    7
  • Issue
    2
  • fYear
    2008
  • fDate
    3/1/2008 12:00:00 AM
  • Firstpage
    181
  • Lastpage
    184
  • Abstract
    A gate-all-around (GAA) twin silicon nanowire MOSFET (TSNWFET) with 5-nm-radius channels on a bulk Si wafer is successfully fabricated to achieve extremely high-drive currents of 2.37 mA/ mum for n-channel and 1.30 mA/ mum for p-channel TSNWFETs with mid-gap TiN metal gate that are normalized by a nanowire diameter. It also shows good short-channel effects immunity down to 30-nm gate length due to the GAA structure and the nanowire channel. The effect of bottom parasitic transistor in TSNWFET is also investigated.
  • Keywords
    MOSFET; elemental semiconductors; silicon; extremely high-drive currents; nanowire diameter; p-channel TSNWFETs; parasitic transistor; twin silicon nanowire MOSFET; 5 nm; 5nm; Bulk MOSFET; MOSFET; TSNWFET; Twin Silicon nanowire; bulk MOSFET; gate all around; gate all around (GAA); high performance; nanowire; twin silicon nanowire;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2008.917843
  • Filename
    4445654