Title :
Reliability of Light Emitters and Detectors for Optical Fiber Communication Systems
Author :
Yonezu, Hiroo ; Katayama, Shoji ; Fujine, Nobuhiko ; Sakuma, Isamu ; Nishida, Katsuhiko
Author_Institution :
NEC, Ltd., Kawasaki, Japan
fDate :
4/1/1983 12:00:00 AM
Abstract :
Life test results on light emitters and detectors showed promisingly long lifetimes for short and long wavelength optical fiber communication systems. Data are presented on 0.85 μm AIGaAs LD´s and LED´s, Si APD´s and p-i-n-PD´s, 1.3 μm InGaAsP LD´s and LED´s, and Ge APD´s and PD´s. Degradation mechanisms and counteractions are also discussed.
Keywords :
Avalanche photodiodes; Communication system reliability; Gallium materials/devices; Life testing; Optical fiber receivers; Optical fiber transmitters, LEDs; Optical fiber transmitters, lasers; Semiconductor device reliability testing; p-i-n photodiodes; Degradation; Epitaxial growth; Light emitting diodes; Optical detectors; Optical fiber communication; Power system reliability; Stimulated emission; Substrates; Surface emitting lasers; Waveguide lasers;
Journal_Title :
Selected Areas in Communications, IEEE Journal on
DOI :
10.1109/JSAC.1983.1145937
