Detection of multiple faults in two-dimensional ILAs

Author

Schlag, Martine ; Ferguson, F. Joel

Author_Institution

Comput. Eng. Board, California Univ., Santa Cruz, CA, USA

Volume

45

Issue

6

fYear

1996

fDate

6/1/1996 12:00:00 AM

Firstpage

741

Lastpage

746

Abstract

We provide test sets proportional to the sum of the two dimensions of the array for a large class of cells, which allow us to test rows (or columns) of cells of the array independently. Constant length test sets for array multipliers have been found under the single faulty cell model if the array is modified, and otherwise test sets are proportional to the number of cells. We can verify the full adder array of a combinational n×m multiplier in O(n+m) tests under the Multiple Faulty Cell (MFC) model. The entire multiplier, including the AND gates which generate the summands, can be verified after applying the same modifications which make the multiplier C-testable under the single faulty cell model

Keywords

combinational circuits; fault diagnosis; logic arrays; logic testing; multiplying circuits; AND gates; C-testable; array multipliers; combinational n×m multiplier; full adder array; functional testing; iterative logic arrays; multiple faults; multipliers; single faulty cell model; summands; test sets; Adders; Arithmetic; Circuit faults; Circuit testing; Combinational circuits; Fault detection; Integrated circuit interconnections; Logic arrays; Logic testing; Sufficient conditions;

fLanguage

English

Journal_Title

Computers, IEEE Transactions on

Publisher

ieee

ISSN

0018-9340

Type

jour

DOI

10.1109/12.506429

Filename

506429