DocumentCode :
1056276
Title :
Technology of GaAs metal—Oxide—Semiconductor solar cells
Author :
Stirn, Richard J. ; Yeh, Y.C.M.
Author_Institution :
California Institute of Technology, Pasadena, CA
Volume :
24
Issue :
4
fYear :
1977
fDate :
4/1/1977 12:00:00 AM
Firstpage :
476
Lastpage :
483
Abstract :
The growth of an oxide interfacial layer was recently found to increase the open-circuit voltage (Voc) and efficiency by up to 60 percent in GaAs metal-semiconductor solar cells. Several oxidation techniques have been developed which will provide the necessary oxide thickness and chemical structure. Details of these techniques using ozone, water-vapor-saturated oxygen, or oxygen gas discharges are described, as well as apparent crystallographic orientation effects. Preliminary results of the oxide chemistry obtained from X-ray, photoelectron spectroscopy are given. Ratios of arsenic oxide to gallium oxide of unity or less seem to be preferable. Samples with the highest Vocpredominantly have As+3in the arsenic oxide rather than As+5. A major difficulty at this time is a reduction in open-circuit Voltage by 100-200 mv when the antireflection coating is vacuum deposited. Without this effect, values of about 750 mV for Vocand 15-percent efficiency with air mass of 1 sun can be obtained with single-crystal GaAs. All techniques are compatible with polycrystalline GaAs thin films.
Keywords :
Chemicals; Chemistry; Coatings; Crystallography; Discharges; Gallium arsenide; Oxidation; Photovoltaic cells; Spectroscopy; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1977.18762
Filename :
1478954
Link To Document :
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