• DocumentCode
    1056527
  • Title

    DIFMOS—A floating-gate electrically erasable nonvolatile semiconductor memory technology

  • Author

    Gosney, W. Milton

  • Author_Institution
    Texas Instruments, Inc., Dallas, TX
  • Volume
    24
  • Issue
    5
  • fYear
    1977
  • fDate
    5/1/1977 12:00:00 AM
  • Firstpage
    594
  • Lastpage
    599
  • Abstract
    Electrically alterable read-only memories (EAROM´s) or reprogrammable read-only memories (RPROM´s) can be fabricated using a single-level metal-gate p-channel MOS technology with all conventional processing steps. Given the acronym DIFMOS for dual-injector floating-gate MOS, this technology utilizes the floating-gate technique for nonvolatile storage of data. Avalanche injection of hot electrons through gate oxide from a special injector diode in each bit is used to charge the floating gates. A second injector structure included in each bit permits discharge of the floating gate by avalanche injection of holes through gate oxide. The overall design of the DIFMOS bit is dictated by the physical considerations required for each of the avalanche injector types. The end result is a circuit technology which can provide fully decoded bit-erasable EAROM-type circuits using conventional manufacturing techniques.
  • Keywords
    Charge carrier processes; Circuits; Electrons; Nonvolatile memory; PROM; Read only memory; Semiconductor device manufacture; Semiconductor diodes; Semiconductor memory; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1977.18786
  • Filename
    1478978