A new miniature magnetic field probe for measuring three-dimensional fields in planar high-frequency circuits

Author

Gao, Yingjie ; Wolff, Ingo

Author_Institution

Dept. of Electr. Eng., Gerhard Mercator Univ., Duisburg, Germany

Volume

44

Issue

6

fYear

1996

fDate

6/1/1996 12:00:00 AM

Firstpage

911

Lastpage

918

Abstract

A new noncontacting miniature magnetic field probe for measuring the surface current distribution on high-frequency planar circuits in x-, y-, z-directions in the 1-20 GHz band has been designed, fabricated and tested. The field probes have very small dimensions and do not need any connection to the operating circuit under test, therefore there is almost no perturbation of the circuit properties. This simple and practical magnetic field probes can be used to assist the design of microwave circuits, antenna diagnostics and to test products in industry. This paper describes the production procedure of the magnetic field probes, a scanning diagnostic system, measurement examples and comparisons between measurements and calculations. The measurement results agree very well with theoretically expected field distributions

Keywords

current distribution; magnetic field measurement; microwave circuits; microwave measurement; probes; production testing; 1 to 20 GHz; antenna diagnostics; magnetic field probe; microwave circuits; planar high-frequency circuits; scanning diagnostic system; surface current distribution; three-dimensional fields; Antenna measurements; Circuit testing; Current distribution; Current measurement; Magnetic circuits; Magnetic field measurement; Microwave antennas; Microwave circuits; Probes; Production systems;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.506451

Filename

506451