DocumentCode :
1056725
Title :
Performance and reliability of an improved high-temperature GaAs Schottky junction and native-oxide passivation
Author :
Calviello, Joseph A. ; Wallace, John L.
Author_Institution :
AIL Division, Deer Park, NY
Volume :
24
Issue :
6
fYear :
1977
fDate :
6/1/1977 12:00:00 AM
Firstpage :
698
Lastpage :
704
Abstract :
We have developed a reliable, high-performance, batch-processed, GaAs tantalum Schottky diode (with a gold overlayer) and native-oxide passivated junction1in a quasi-planar configuration, Varactors and mixers have been fabricated with near-ideal characteristics and state-of-the-art performance. Typically, they exhibit, at 0 V, a junction capacitance near 0.1 pF and a cutoff frequency in excess of 700 GHz when measured at 55 GHz. In a paramp application pumped at 101 GHz, and a signal frequency of 35 GHz, we have obtained a noise figure of 3.5 dB, a gain of 17 dB, and a bandwidth of 600 MHz. When used as frequency doublers (50-100 GHz) and triplers (35-105 GHz), we have realized better than 25-percent efficiency. As mixers, at X band, we achieved a single sideband noise figure of 6 dB and the diodes are typically able to sustain short pulse energy (1.5 × 10-9s) of up to 4.5 ergs with no performance degradation. Reliability tests results to date indicate a MTBF of better than 108h at 100°C and greater than 105h at 200°C. In a commercial application of paramps (3.7-4.2 GHz), these diodes have successfully completed 2.5 million operational varactor hours with no performance degradation.
Keywords :
Capacitance measurement; Cutoff frequency; Degradation; Frequency measurement; Gallium arsenide; Gold; Noise figure; Passivation; Schottky diodes; Varactors;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1977.18806
Filename :
1478998
Link To Document :
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