DocumentCode
1056912
Title
Reliability results on electron bombarded semiconductor power devices
Author
Bates, D.J. ; True, R.
Author_Institution
Watkins-Johnson Company, Palo Alto, CA
Volume
24
Issue
6
fYear
1977
fDate
6/1/1977 12:00:00 AM
Firstpage
773
Lastpage
774
Abstract
A number of pulse and CW EBS power amplifiers have undergone extended life test. No failures have been recorded in over 180 000 test hours on eight CW devices, and one failure occurred in 90 000 test hours on eight pulsed devices.
Keywords
Diodes; Electronic equipment testing; Electrons; Life testing; Power amplifiers; Pulse amplifiers; Pulse measurements; Pulse modulation; Radiofrequency amplifiers; Semiconductor device reliability;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1977.18824
Filename
1479016
Link To Document