• DocumentCode
    1057171
  • Title

    The importance of insulator properties in a thin-film electroluminescent device

  • Author

    Howard, Webster E.

  • Author_Institution
    IBM T. J. Watson Research Center, Yorktown Heights, NY
  • Volume
    24
  • Issue
    7
  • fYear
    1977
  • fDate
    7/1/1977 12:00:00 AM
  • Firstpage
    903
  • Lastpage
    908
  • Abstract
    AC-coupled thin-film electroluminescent devices employ insulating layers to limit the current density through the active layers. The requirements and limitations in driving such devices are then dependent upon the properties of the dielectric layers. We define an external efficiency for an ac thin-film electroluminescent device and consider two limiting cases, current response 1) fast, and 2) slow, compared to an applied voltage change. Relationships are then derived among external efficiency, relative luminance, and the two principal characteristics of the insulating layer, specifically charge density at breakdown and thickness. It is shown, for example, that charge density at breakdown for the insulators should be at least three times the corresponding quantity for the active layer.
  • Keywords
    Breakdown voltage; Dielectric substrates; Dielectric thin films; Dielectrics and electrical insulation; Electric breakdown; Electrodes; Electroluminescent devices; Thin film devices; Threshold voltage; Zinc compounds;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1977.18850
  • Filename
    1479042