DocumentCode
1057171
Title
The importance of insulator properties in a thin-film electroluminescent device
Author
Howard, Webster E.
Author_Institution
IBM T. J. Watson Research Center, Yorktown Heights, NY
Volume
24
Issue
7
fYear
1977
fDate
7/1/1977 12:00:00 AM
Firstpage
903
Lastpage
908
Abstract
AC-coupled thin-film electroluminescent devices employ insulating layers to limit the current density through the active layers. The requirements and limitations in driving such devices are then dependent upon the properties of the dielectric layers. We define an external efficiency for an ac thin-film electroluminescent device and consider two limiting cases, current response 1) fast, and 2) slow, compared to an applied voltage change. Relationships are then derived among external efficiency, relative luminance, and the two principal characteristics of the insulating layer, specifically charge density at breakdown and thickness. It is shown, for example, that charge density at breakdown for the insulators should be at least three times the corresponding quantity for the active layer.
Keywords
Breakdown voltage; Dielectric substrates; Dielectric thin films; Dielectrics and electrical insulation; Electric breakdown; Electrodes; Electroluminescent devices; Thin film devices; Threshold voltage; Zinc compounds;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1977.18850
Filename
1479042
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