DocumentCode :
1057244
Title :
A simple formula for the concentration of charge on a three-dimensional corner of a conductor
Author :
Zhang, Yimin ; Zemanian, A.H.
Author_Institution :
Brookhaven Nat. Lab., Upton, NY, USA
Volume :
44
Issue :
6
fYear :
1996
fDate :
6/1/1996 12:00:00 AM
Firstpage :
975
Lastpage :
979
Abstract :
A major problem in the computation of capacitance coefficients for microwave transmission and VLSI interconnection systems is caused by the singularities in the electric field at the corners and edges of conductors. For edges, a solution is given by the Duncan correction, which is based on a two-dimensional (2-D) polar expansion of the field. No such exact expansion exists for corners. Recent research by Beagles and Whiteman (1989) has yielded an asymptotic expansion for the electric field in the vicinity of a rectangular three-dimensional conductive corner, and this is used to derive a simple formula for the charge Q (in coulombs) concentrated at any such corner. The formula is Q=1.307 εd(Vc-Vs), where ε is the dielectric permittivity (in farads per meter) of the medium surrounding the conductive corner, d is the length (in meters) of one side of a cubic region situated on the conductor adjacent to the corner, Vc is the electric potential (in volts) of the conductor, and Vs is the electric potential at a point in the medium displaced from the corner´s apex along a line through the cube´s diagonal and at a distance equal to that diagonal. Q is the charge on the cube´s three surfaces lying along the conductor´s surfaces. Such a configuration is convenient for a finite-difference computation of capacitance
Keywords :
capacitance; conductors (electric); electric charge; electrostatics; finite difference methods; 3D conductive corner; VLSI interconnection systems; capacitance coefficients; charge concentration; conductor; electric field; finite-difference computation; microwave transmission networks; three-dimensional corner; Capacitance; Conductors; Electric potential; Finite difference methods; Microstrip; Microwave theory and techniques; Millimeter wave technology; Surface resistance; Time domain analysis; Very large scale integration;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.506640
Filename :
506640
Link To Document :
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