DocumentCode :
1057259
Title :
High-efficiency GaP green LED´s by Zinc diffusion into an n-LPE layer
Author :
Beppu, Tatsuro ; Iwamoto, Masami ; Naito, Makoto ; Kasami, Akinobu
Author_Institution :
Tokyo Shibaura Electric Company, Ltd., Kawasaki, Japan
Volume :
24
Issue :
7
fYear :
1977
fDate :
7/1/1977 12:00:00 AM
Firstpage :
951
Lastpage :
955
Abstract :
High-efficiency GaP green LED\´s have been developed by zinc diffusion into nitrogen doped n-type liquid phase epitaxial (LPE) layers. The average efficiency for an encapsulated diode is 0.15 percent at 8 A . cm-2and 0.23 percent at 50 A . cm-2. In order to obtain high-efficiency diodes, an optimum nitrogen doping and a long minority carrier lifetime τhin the n-LPE layer are essential. While increasing nitrogen concentration NT, τhhas a constant value up to a certain NTvalue; at higher NTvalues τhdegrades proportionally to N_{T}^{-2} . The minority carrier lifetime in the low NTregion also depends strongly on the dislocation density of the n-LPE layer. For crystals with a dislocation density less than 2 × 105cm-2, a nitrogen concentration of about 6 × 1017cm-3gives an optimum diode efficiency. A diffusion process, minimizing the deterioration of the n-LPE crystal quality, is also important. A low temperature (600-700°C) diffusion at an optimum phosphorus pressure has been developed.
Keywords :
Charge carrier lifetime; Crystals; Degradation; Doping; Electrodes; Light emitting diodes; Nitrogen; P-n junctions; Temperature measurement; Zinc;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1977.18857
Filename :
1479049
Link To Document :
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