DocumentCode :
1057584
Title :
Bandgap narrowing in silicon bipolar transistors
Author :
Slotboom, J.W. ; de Graaff, H.C.
Author_Institution :
Philips Research Laboratories, Eindhoven, The Netherlands
Volume :
24
Issue :
8
fYear :
1977
fDate :
8/1/1977 12:00:00 AM
Firstpage :
1123
Lastpage :
1125
Abstract :
Martinelli [1] recently reported on measurements of the I-V characteristics of silicon bipolar transistors as a function of temperature. His conclusion was that there was no evidence of bandgap narrowing in the transistors. Our experiments [2] on n-p-n transistors indicate that the bandgap does narrow for impurity concentrations above N = 10^{17} cm-3. The reason for this discrepancy follows from Martinelli\´s assumption that the temperature dependence of the minority carrier mobility in the p-type base is given by T-2.6, independently of the impurity concentration, which is not justified by our measurements.
Keywords :
Bipolar transistors; Current measurement; Displays; Doping; Electrodes; Gain measurement; Impurities; Photonic band gap; Silicon; Temperature dependence;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1977.18889
Filename :
1479081
Link To Document :
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