Title :
Silicon Carbide Integrated Circuits With Stable Operation Over a Wide Temperature Range
Author :
Ghandi, Reza ; Cheng-Po Chen ; Liang Yin ; Xingguang Zhu ; Liangchun Yu ; Arthur, Stephen ; Ahmad, Farhan ; Sandvik, Peter
Author_Institution :
GE Global Res. Center, Schenectady, NY, USA
Abstract :
In this letter, silicon carbide MOSFET-based integrated circuits have been designed, fabricated, and successfully tested from -193 °C (80 K) to 500 °C. Silicon carbide single MOSFETs remained fully operational over a 700-°C wide temperature range and exhibited stable I-V characteristics. The circuits that include operational amplifier (op-amp), 27-stage ring oscillator, and buffer were tested and shown to be functional up to 500 °C with relatively small performance variation between 300 °C and 500 °C. High-temperature evaluation of these circuits confirmed stable operation and survivability of both the ring oscillator and op-amp for more than 100 h at 500 °C.
Keywords :
MOSFET; buffer circuits; operational amplifiers; oscillators; silicon compounds; wide band gap semiconductors; 27-stage ring oscillator; SiC; buffer; high-temperature evaluation; op-amp; operational amplifier; silicon carbide integrated circuits; single MOSFET; stable I-V characteristics; stable operation; temperature -193 degC to 500 degC; wide temperature range; High-temperature techniques; Integrated circuits; MOSFET; Ring oscillators; Silicon carbide; Silicon carbide; high temperature electronics; high temperature electronics.; integrated circuits;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2014.2362815