DocumentCode :
1057644
Title :
Real-time secondary electron emission detector for high-rate X-ray crystallography
Author :
Chechik, R. ; Breskin, A. ; Frumkin, I. ; Gabrie, A. ; Kocsis, M.
Author_Institution :
Weizmann Inst. of Sci., Rehovot, Israel
Volume :
43
Issue :
3
fYear :
1996
fDate :
6/1/1996 12:00:00 AM
Firstpage :
1248
Lastpage :
1252
Abstract :
We present the first results of the application of a novel digital X-ray imaging detector, based on secondary electron emission from a solid converter, to high-rate crystallographic studies. Results from diffraction and small-angle scattering experiments from several crystallized proteins, performed at the European Synchrotron Radiation Facility, ESRF, Grenoble, are presented and compared with a phosphor-based imaging system. Future developments of this detector system are proposed
Keywords :
X-ray crystallography; X-ray imaging; multiwire proportional chambers; position sensitive particle detectors; proportional counters; secondary electron emission; crystallized proteins; digital X-ray imaging detector; high-rate X-ray crystallography; high-rate crystallographic studies; phosphor-based imaging system; real-time secondary electron emission detector; secondary electron emission; Crystallization; Crystallography; Electron emission; Proteins; Solids; X-ray detection; X-ray detectors; X-ray diffraction; X-ray imaging; X-ray scattering;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.506672
Filename :
506672
Link To Document :
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