DocumentCode :
1057717
Title :
Theory of CCD transfer noise from a circuit model
Author :
Donati, S. ; Svelto, V.
Author_Institution :
Università di Pavia, Pavia, Italy
Volume :
24
Issue :
9
fYear :
1977
fDate :
9/1/1977 12:00:00 AM
Firstpage :
1184
Lastpage :
1186
Abstract :
The transfer function and noise of a CCD can be accounted for by a simple block model of the elementary cell. From the analysis of an n -cell device, the noise properties of the output signal are derived in both the frequency and the time domain. The approach requires no approximations to calculate the power spectral density and amplitude variance so that the validity of asymptotic expressions can be evaluated. The model lends itself easily to include noise sources other than the transfer noise.
Keywords :
Charge coupled devices; Circuit noise; Dark current; Fluctuations; Frequency; Noise generators; Signal analysis; Signal processing; Time domain analysis; Transfer functions;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1977.18903
Filename :
1479095
Link To Document :
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