DocumentCode
1058199
Title
IVa-2 Determination of surface state capture cross section from transfer loss measurements in CCD´s
Author
Kriegler, R.J. ; Shappir, Joseph ; Devenyi, T.F.
Volume
24
Issue
9
fYear
1977
fDate
9/1/1977 12:00:00 AM
Firstpage
1206
Lastpage
1207
Keywords
Clocks; Delay effects; Electrons; Frequency measurement; Loss measurement; Materials science and technology; Surface resistance; Thin film devices; Thin film sensors; Thin film transistors;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1977.18950
Filename
1479142
Link To Document