Title :
IVa-2 Determination of surface state capture cross section from transfer loss measurements in CCD´s
Author :
Kriegler, R.J. ; Shappir, Joseph ; Devenyi, T.F.
fDate :
9/1/1977 12:00:00 AM
Keywords :
Clocks; Delay effects; Electrons; Frequency measurement; Loss measurement; Materials science and technology; Surface resistance; Thin film devices; Thin film sensors; Thin film transistors;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1977.18950
